TESTCOM® CUBE TESTER PLATFORM,
SCALABLE IN SIZE AND FUNCTIONS
TESTCOM® CUBE TESTER PLATFORM FOR PCB AND PCBA TESTING IS AVAILABLE IN FOUR MECHANICAL SIZES AND THREE INSTRUMENT CATEGORIES. TESTCOM® CUBE TESTERS ARE A COMBINATION OF HIGH QUALITY AND RELIABLE DEVICES AND DECADES OF DESIGN EXPERTISE.
The functionality of the TESTCOM® CUBE testers is created by our electrical, mechanical and software expertise together with our partners. That makes TESTCOM® CUBE Testers unique.
As a Core of the TESTCOM® CUBE tester is either a Testcom test sequencer or National Instruments Test Stand. Test data is analyzed with the TESTCOM® TDV2018 database tool.
TESTCOM® CUBE tester combined with MG Product’s test fixture and replaceable cassette or fixture interface enhances tester usability. Predetermined instrument categories can be selected, or testers can be tailored into customer needs. All TESTCOM® CUBE versions can be equipped with boundary scan modules and automated optical identification.
TESTCOM® CUBE TESTER PLATFORM AVAILABLE IN 4 SIZES
TESTCOM® CUBE S
CUBE S is a stand-alone tabletop test fixture where instruments can be located inside the test fixture or on the table. Simple structure allows very fast implementation and deliveries, which makes CUBE S ideal for R&D, piloting and small series needs. Even though CUBE S size is limited we can equip CUBE S for various testing needs.
TESTCOM® CUBE M
CUBE M is a tabletop tester solution with compact instrument rack to keep testing area well organized. The modular design makes it possible to combine Cube testers later if needed. CUBE M together with CE or Modular instrument categories gives high value for your investment.
TESTCOM® CUBE L
CUBE L is compact independent testing cell on the wheels. Devices are mounted on a 19” instrument rack. As in all CUBE sizes you can select one of our predefined instrument categories or we can tailor CUBE L for your needs. CUBE L is best choice for Modular or Pro instrument categories.
TESTCOM® CUBE XL
CUBE XL is a widely used full-scale independent testing cell. With the predefined Pro category instruments mounted in the 19’’ tester tower various test requirements can be fulfilled. CUBE XL is the best choice for advanced testing needs.
TESTCOM® CUBE MOD
CUBE MOD instruments give high value and modularity for the testing system. The NI PXI devices and modular power supply modules can be selected based to the testing application needs. The system can be also tailored for the application needs.
TESTCOM® CUBE PRO
CUBE PRO predefined instruments cover versatile needs for functional testing. High quality instruments mounted into the CUBE XL tester tower are the best choice for advanced testing needs
TEST SEQUENCING AND RESULT ANALYSIS
All TESTCOM® CUBE testers are equipped with tools for test sequencing and result analysis.
CATEGORIES OF TESTCOM CUBE INSTRUMENTS
Testcom CUBE CE
CUBE CE instruments give high value with reasonable cost. NI VirtualBench combined with Testcom multiplexer unit gives the core functionality for the tester. You can enhance the functionality with power supplies or Boundary Scan modules when needed.
TEST SEQUENCING AND RESULT ANALYSIS
All Testcom CUBE testers are equipped with tools for test sequencing and result analysis.
TDV 2018 highlights
• Real-time visual and numeric reporting
• Advanced searching capabilities and filtering of the views
• FPY, CPK and trend calculations real-time
• Year, month and week reports
• Decentralized database possibility.
|EQUIPMENTS TEST STATION||SPECIFICATION||CUBE CE||CUBE MOD||CUBE PRO|
|Enclosure, mechanical size||Testcom CUBE S||x|
|Testcom CUBE M||x||x|
|Testcom CUBE L||x||x||x|
|Testcom CUBE XL||x||x||x|
|Testcom CUBE XL||1P 1-3 kVA||x|
|HP Z series||x||x||x|
|DC power supplies Keysight||0-8 VDC/6,25 A||x||x|
|2 x 0-35 VDC/1,5 A||x||x|
|0-100 VDC/0,5 A||x||x|
|0-30 VDC/25 A||x|
|0-150 VDC/5 A||x|
|0-300 VAC/3,25 A||x|
|DC power supplies TTI||PowerFlex’ Max 60 V or 20 A||x||x|
|Dual 0-56 V/4 A max +1-6 V/3 A||x||x|
|PXI Instruments||PXI Chassis||x||x|
|6 1/2 Digit FlexDMM||x||x|
|32 AI, 48 DIO, 4 AO||x||x|
|Electric DC Load||4 x 60 A/80 V/300 W||x||x|
|Waveform generator||Arbitrary/function gen. 25 MHz||x|
|Oscilloscope digital storage||60 MHz/ 2 CH||x|
|High accuracy DC source||+/- 32 VDC, +/- 200 mA||x|
|Digital multimeter||8,5 digit||x|
|Relay matrix||DIO 48 CH||x||x||x|
|Signal relay 1A 256 CH||x||x||x|
|Power relay 10 A 30 CH||x||x||x|
|Led analyzer||10 Channels||x||x||x|
|Test Sequencer||Testcom Labview test engine||x||x||x|
|NI Test Stand||x||x||x|
|Test Data Analyze||Local server installation||x||x||x|
|Boundary scan Controller||JTAG Controller||x||x||x|
|Cassette connection interface||x||x||x|
|Fixture connection interface||x||x||x|
x = suitable choice